SE-LTL Model-checking on Timed GRAFCETS via ε-TPN

Médésu Sogbohossou *

Laboratoire d’Èlectrotechnique, de Télécommunications et d’Informatique Appliquée (LETIA), Ècole Polytechnique d’Abomey-Calavi (EPAC), UAC, 01 BP 2009 Cotonou, Benin.

Rodrigue Yehouessi

Laboratoire d’Èlectrotechnique, de Télécommunications et d’Informatique Appliquée (LETIA), Ècole Polytechnique d’Abomey-Calavi (EPAC), UAC, 01 BP 2009 Cotonou, Benin.

Tahirou Djara

Laboratoire d’Èlectrotechnique, de Télécommunications et d’Informatique Appliquée (LETIA), Ècole Polytechnique d’Abomey-Calavi (EPAC), UAC, 01 BP 2009 Cotonou, Benin.

Theophile Aballo

Laboratoire d’Èlectrotechnique, de Télécommunications et d’Informatique Appliquée (LETIA), Ècole Polytechnique d’Abomey-Calavi (EPAC), UAC, 01 BP 2009 Cotonou, Benin.

Antoine Vianou

Laboratoire d’Èlectrotechnique, de Télécommunications et d’Informatique Appliquée (LETIA), Ècole Polytechnique d’Abomey-Calavi (EPAC), UAC, 01 BP 2009 Cotonou, Benin.

*Author to whom correspondence should be addressed.


Abstract

The GRAFCET standard (IEC 60848) is one of the convenient formalisms used to specify the behaviour of the automated systems. Being just a semi-formal language, the usual practice is to go through an unambiguous formalism such as time Petri net (TPN) in order to validate a specification expressed by a GRAFCET model. In this paper, we propose how to perform model-checking on a GRAFCET model translated into a ε-TPN, specifically with State-Event Linear Temporal Logic (SE-LTL). Especially, we provide a way to take into account quantitative time constraints verification by integrating observers in the ε-TPN intermediate model, since TPN state-space abstractions do not allow directly such kind of model-checking.

Keywords: GRAFCET (IEC 60848), Time Petri Net (TPN), model-checking, SE-LTL, observer.


How to Cite

Sogbohossou, Médésu, Rodrigue Yehouessi, Tahirou Djara, Theophile Aballo, and Antoine Vianou. 2019. “SE-LTL Model-Checking on Timed GRAFCETS via ε-TPN”. Current Journal of Applied Science and Technology 38 (6):1-12. https://doi.org/10.9734/cjast/2019/v38i630433.

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